Copper Grain Structure Influences Stress Around Scaled TSVs (Purdue, UCLA)
Purdue and UCLA study mechanical stress in advanced packaging through-silicon vias
Academic researchers from Purdue University and UCLA have investigated how copper grain structures affect residual stress around through-silicon vias. The technical study examined scaled three-micrometre via arrays subjected to high-temperature annealing. Understanding these mechanical stresses is critical for improving reliability in advanced 3D semiconductor packaging.
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This summary was written by the GPU Data Hub desk from reporting published by Semiconductor Engineering on 28 Sept 2026, 18:02. Read the full article at the original publisher.
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