Beyond The EPE Budget: Building The Next Generation Of Computational Lithography
Advances in modelling and metrology aim to sustain chip scaling limits

Advanced computational lithography requires enhanced physical modelling, improved metrology systems, and interpretable machine learning to push chip scaling further. Collaborative efforts across the semiconductor supply chain are increasingly critical as traditional edge placement error budgets face mounting physical constraints.
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This summary was written by the GPU Data Hub desk from reporting published by Semiconductor Engineering on 22 Oct 2026, 07:08. Read the full article at the original publisher.
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