Fast, Sub-Volt HZO Ferroelectric Capacitors For DRAM-Like Memory (SNU)
Novel ferroelectric capacitor design overcomes key speed and endurance barriers
Researchers led by Seoul National University have developed sub-volt ferroelectric capacitors designed for DRAM-style memory applications using hafnium zirconium oxide. The development resolves long-standing trade-offs between switching speeds and cycling endurance at low voltage levels.
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This summary was written by the GPU Data Hub desk from reporting published by Semiconductor Engineering on 3 Nov 2026, 17:10. Read the full article at the original publisher.
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